Probe Card
Product
The Probe Card is an important piece of equipment used in the testing process of semiconductor chips, and is used to test individual chips on semiconductor wafers. It is primarily used in wafer-level testing, and is a tool for identifying electrical properties before a chip is packaged.
Probe Card Design Responsible Work
(Classification by task)
| No | Assortment | Category | Work | Result | File Format |
|---|---|---|---|---|---|
| 1-1 | New Review |
Review of Development possibilities |
Verify Probe array and Head configuration | Probe Array Drawings | Auto CAD |
| 1-2 | Create a TD Map and determine the number of Para | TD MAP(Shared Map) | Excel | ||
| 1-3 | Channel Assign | Channel Assign Sheet | Excel | ||
| 1-4 | Creating a Block Diagram and Configuring a Circuit | Net list | Excel | ||
| 1-5 | MLC Confirms PCB Expected Layer | Stack up | Excel | ||
| 2-1 | Circuit Design |
MLC Design (Layout) |
Top and Bottom Thin Film Design (Tip, LGA, Part Arrangement) |
MLC Thin Film Drawings | Auto CAD |
| 2-2 | MLC Inner Layer Design | MLC Inner Layer drawing | Allegro | ||
| 2-3 | PCB Design (Layout) |
Placement of parts and check availability | PCB Layout drawing | Auto CAD | |
| 2-4 | PCB Inner Layer Design | PCB Inner Layer drawing | Allegro | ||
| 3-1 | Circuit Analysis | Signal Integrity | TPD Analysis and Selection | Seletion of TPD Target and Wiring Length | Excel |
| 3-2 | Insertion Loss, Eye Open, X-Talk | Simulation result | Touchstone File | ||
| 3-3 | Power Integrity | PDN, IR DROP | Simulation result | Touchstone File |
Probe Card Design Responsible Work
(Classification by Product)
| Assortment | Device | Circuit | ||||
|---|---|---|---|---|---|---|
| MLC | PCB | MLO | Checker Board | Simulation | ||
| Memory | Nand Flash [EDS/WFB] | |||||
| DRAM [EDS/WFB] | ||||||
| HBM | ||||||
| CIS | ||||||
| Non Memory | SSD Controller | |||||
| SoC | ||||||
| DDI | ||||||
| SMART IC | ||||||